Stork experts to present microscopy seminars at Michigan State University March 18

EAST LANSING, MI—March 6, 2008

Stork experts have been invited to present at "What's New in Electron Microscopy," a one-day continuing education seminar sponsored by the Saginaw Valley Chapter of ASM International and the MSU Chapter of MSES, the Materials Science and Engineering Society, and hosted by Michigan State University, East Lansing, Michigan, on Tuesday, March 18. The all-day program covers current electron microscopy methods for metals, failure analysis of polymers, and mapping crystal orientations and phase distributions using Electron Backscatter Diffraction or EBSD.

John Tartaglia of Stork CRS and Jeffrey Jansen of Stork Technimet will present two of the three education segments:

• SEM and EDS Basics & Metallic Case Studies
  Dr. John Tartaglia, from Stork Climax Research Services in Wixom, Michigan, will review the basic operation of electron microscopes and EDS systems, as well as share recent case studies illustrating applications of the most current methods to metals. 
• Electron Microscopy for Polymer Failure Analysis
  Jeffrey A. Jansen, from Stork Technimet in New Berlin, Wisconsin, will describe the role of electron microscopy in failure analysis of polymers.  Mr. Jansen authored the polymer failure analysis section of the ASM Handbook Volume 11, Failure Analysis.
• Electron Backscatter Diffraction (EBSD) and Orientation Imaging (OI)
  Laurie Krupa of Ametek will introduce participants to EBSD and OI. These methods map crystal orientations and phase distributions over a wide range of microstructural scales. Industrial applications will be presented by Dr. Raj Mishra, Staff Research Scientist at GM’s North American R&D Center.